31 results
A Method for Plan-View FIB Liftout of Near Surface Defects with Minimal Beam-Induced Damage
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- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 842-843
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- August 2018
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The Effect of Postemergence Herbicides on the Spectral Reflectance of Corn
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- Weed Technology / Volume 22 / Issue 3 / September 2008
- Published online by Cambridge University Press:
- 20 January 2017, pp. 514-522
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Using remote sensing to detect weed infestations in Glycine max
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- Weed Science / Volume 48 / Issue 3 / June 2000
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- 20 January 2017, pp. 393-398
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Feral Rye (Secale cereale) in Agricultural Production Systems
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- Weed Technology / Volume 20 / Issue 3 / September 2006
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- 20 January 2017, pp. 815-823
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Detection of Weed Species in Soybean Using Multispectral Digital Images
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- Weed Technology / Volume 18 / Issue 3 / September 2004
- Published online by Cambridge University Press:
- 20 January 2017, pp. 742-749
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Evaluation of Corn (Zea mays L.) Yield-loss Estimations by WeedSOFT® in the North Central Region
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- Weed Technology / Volume 19 / Issue 4 / December 2005
- Published online by Cambridge University Press:
- 20 January 2017, pp. 1056-1064
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Using soil parameters to predict weed infestations in soybean
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- Weed Science / Volume 49 / Issue 3 / June 2001
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- 20 January 2017, pp. 367-374
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Determining Interplanar Distances from STEM-EDX Hyperspectral Maps
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- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 944-945
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- July 2016
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Line Defects at Interfaces in Telluride-Based Thermoelectric Materials
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- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 08 April 2017, pp. 1344-1345
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- July 2011
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Atomistic Studies of Line Defects at Grain Boundaries
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- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
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- 03 August 2008, pp. 900-901
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- August 2008
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High Resolution STEM Tomography of Nanomaterials
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- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
- Published online by Cambridge University Press:
- 31 July 2006, pp. 1548-1549
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- August 2006
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Accommodation of Grain Boundary Coherency Strain by Interfacial Disconnections
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- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
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- 31 July 2006, pp. 888-889
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- August 2006
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Nanoscale Grain Boundary Dissociation: Role of Shockley Partial Dislocations
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- Microscopy and Microanalysis / Volume 8 / Issue S02 / August 2002
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- 01 August 2002, pp. 1166-1167
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- August 2002
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Substrate composition effects on the interfacial fracture of tantalum nitride films
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- Journal of Materials Research / Volume 14 / Issue 6 / June 1999
- Published online by Cambridge University Press:
- 31 January 2011, pp. 2306-2313
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- June 1999
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Microstructure in Nanophase and Amorphous Boron-Based Thin Films
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- Microscopy and Microanalysis / Volume 4 / Issue S2 / July 1998
- Published online by Cambridge University Press:
- 02 July 2020, pp. 710-711
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- July 1998
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Determination Of Rigid-Body Lattice Translations Across Antiphase and Twin Boundaries in Compound Semiconductors
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- Microscopy and Microanalysis / Volume 4 / Issue S2 / July 1998
- Published online by Cambridge University Press:
- 02 July 2020, pp. 786-787
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- July 1998
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Image Periodicities Introduced by Three-Fold Astigmatism in HRTEM Images of α-Al2O3 and Related Materials
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- Microscopy and Microanalysis / Volume 4 / Issue S2 / July 1998
- Published online by Cambridge University Press:
- 02 July 2020, pp. 596-597
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- July 1998
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Beam Induced Composition Modifications During Electron Beam Microanalysis
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- Microscopy and Microanalysis / Volume 4 / Issue S2 / July 1998
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- 02 July 2020, pp. 228-229
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- July 1998
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Preparation of wurtzitic AlN thin films with a novel crystallographic alignment on MgO substrates by molecular-beam epitaxy
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- Journal of Materials Research / Volume 13 / Issue 6 / June 1998
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- 31 January 2011, pp. 1414-1417
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- June 1998
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Test Rate Effects on The Mechanical Behavior of Thin Aluminum Films
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- MRS Online Proceedings Library Archive / Volume 522 / 1998
- Published online by Cambridge University Press:
- 10 February 2011, 281
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- 1998
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